Cross-Order Echelle Grating Triplexer Based on Amorphous Silicon Nanowire Platform

被引:0
作者
Zhu, Ning [1 ,2 ,3 ,4 ]
Song, Jun [1 ,2 ,3 ]
Wosinski, Lech [2 ,3 ,4 ]
He, Sailing [1 ,2 ,3 ]
机构
[1] Zhejiang Univ, Ctr Opt & Electromagnet Res, State Key Lab Modern Opt Instrumentat, Hangzhou, Zhejiang, Peoples R China
[2] Royal Inst Technol, Joint Res Ctr Photon, Stockholm, Sweden
[3] Zhejiang Univ, Hangzhou, Zhejiang, Peoples R China
[4] Royal Inst Technol, Dept Microelect & Appl Phys, S-16440 Kista, Sweden
来源
2008 7TH INTERNATIONAL CONFERENCE ON THE OPTICAL INTERNET (COIN) | 2008年
关键词
Waveguide components; SOI; WDM; integrated optoelectronics; triplexer;
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
We present fabrication and measurement results of an ultracompact silicon-on-insulator-based echelle-grating triplexer, which uses different diffraction orders to cover a large spectral range from 1.3 mu m to 1.5 mu m, with a footprint of 150 mu m x 200 mu m.
引用
收藏
页码:37 / +
页数:2
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