Model-driven photometric stereo for in-process inspection of non-diffuse curved surfaces

被引:8
作者
Ren, Mingjun [1 ]
Xia, Gaobo [1 ]
Zhu, Limin [1 ]
Zeng, Wenhan [2 ]
Whitehouse, David [3 ]
机构
[1] Shanghai Jiao Tong Univ, Sch Mech Engn, State Key Lab Mech Syst & Vibrat, Shanghai, Peoples R China
[2] Univ Huddersfield, Sch Comp & Engn, EPSRC Future Metrol Hub, Huddersfield, W Yorkshire, England
[3] Univ Warwick, Sch Engn, Coventry, W Midlands, England
基金
英国工程与自然科学研究理事会; 中国国家自然科学基金;
关键词
Surface; Quality control; Visual inspection; NEURAL-NETWORK;
D O I
10.1016/j.cirp.2019.04.013
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents an in-process inspection approach for quality control of non-diffuse curved surfaces based upon an evolution of conventional photometric stereo. An inverse reflectance model is proposed to reveal the non-linear reflectance behaviour of general non-diffuse surfaces from images based on a neural network. The model can directly be used to drive a high accurate photometric stereo which only requires a single RGB image with a pre-captured collocated image. This allows the technique to realize in-process inspection of moving surfaces with micro-second level capturing rate. Experimental study confirms the excellent texture recovery and defect detection capabilities in mass production. (C) 2019 Published by Elsevier Ltd on behalf of CIRP.
引用
收藏
页码:563 / 566
页数:4
相关论文
共 16 条
  • [1] [Anonymous], 1980, OPT ENG
  • [2] Example-based photometric stereo: Shape reconstruction with general, varying BRDFs
    Hertzmann, A
    Seitz, SM
    [J]. IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2005, 27 (08) : 1254 - 1264
  • [3] Reflectance Capture using Univariate Sampling of BRDFs
    Hui, Zhuo
    Sunkavalli, Kalyan
    Lee, Joon-Young
    Hadap, Sunil
    Wang, Jian
    Sankaranarayanan, Aswin C.
    [J]. 2017 IEEE INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV), 2017, : 5372 - 5380
  • [4] Photometric Stereo using Constrained Bivariate Regression for General Isotropic Surfaces
    Ikehata, Satoshi
    Aizawa, Kiyoharu
    [J]. 2014 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2014, : 2187 - 2194
  • [5] Technological shifts in surface metrology
    Jiang, X. Jane
    Whitehouse, David J.
    [J]. CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2012, 61 (02) : 815 - 836
  • [6] Development of an inspection system for planar steel surface using multispectral photometric stereo
    Kang, Dongyeop
    Jang, Yu Jin
    Won, Sangchul
    [J]. OPTICAL ENGINEERING, 2013, 52 (03)
  • [7] Surface segmentation by variable illumination
    Leon, F. Puente
    Lindner, C.
    van Gorkom, D.
    [J]. CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2007, 56 (01) : 549 - 552
  • [8] A data-driven reflectance model
    Matusik, W
    Pfister, H
    Brand, M
    McMillan, L
    [J]. ACM TRANSACTIONS ON GRAPHICS, 2003, 22 (03): : 759 - 769
  • [9] Median Photometric Stereo as Applied to the Segonko Tumulus and Museum Objects
    Miyazaki, Daisuke
    Hara, Kenji
    Ikeuchi, Katsushi
    [J]. INTERNATIONAL JOURNAL OF COMPUTER VISION, 2010, 86 (2-3) : 229 - 242
  • [10] Improvement of Developmental Drawing Imitation Using Recurrent Neural Network Through Incorporation of AVITEWRITE Model
    Nishide, Shun
    Ren, Fuji
    [J]. 2018 IEEE INTERNATIONAL CONFERENCE ON SYSTEMS, MAN, AND CYBERNETICS (SMC), 2018, : 1 - 5