Space-charge effects in ionization beam profile monitors

被引：5
作者：
Shiltsev, Vladimir [1 ]
机构：
[1] Fermilab Natl Accelerator Lab, POB 500,MS339, Batavia, IL 60510 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2021年 / 986卷
基金：
美国能源部;
关键词：
Beam diagnostics; Ionization; Space-charge effects;
D O I：
10.1016/j.nima.2020.164744
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Ionization profile monitors (IPMs) are widely used in accelerators for non-destructive and fast diagnostics of high energy particle beams. At high beam intensities, the space-charge forces make the measured IPM profiles significantly different from those of the beams. We analyze dynamics of the secondaries in IPMs and develop an effective algorithm to reconstruct the beam sizes from the measured IPM profiles. Efficiency of the developed theory is illustrated in application to the Fermilab 8 GeV proton Booster IPMs.
引用
收藏
页数：5
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