AC-JTAG: Empowering JTAG beyond testing DC nets

被引：7

作者：

Chung, SS ^{[1
]}

Baeg, SH ^{[1
]}

机构：

[1] Cisco Syst Inc, San Jose, CA 95134 USA

来源：

INTERNATIONAL TEST CONFERENCE 2001, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/TEST.2001.966615

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper presents the new technology, that extends today's JTAG's capability, from DC domain to both AC and DC domains. New concept, AC_EXTEST is introduced to support A C interconnection test and to have backward compatibility, with EXTEST It leverages existing application software available within boundary-scan test industry to promote this technology, to manufacturing floor with minimal impact.

引用

页码：30 / 37

页数：8

共 9 条

[1]

[Anonymous], 1993, 11491A1993 IEEE

[2]

[Anonymous], 114941999 IEEE

[3]

BENNER AF, 1996, FIBRE CHANNEL GIGABI

[4]

*IEEE, 1995, 114911990 IEEE

[5]

Nadeau-Dostie B., 1999, P INT TEST C, P431

[6]

PARKER KP, 1998, BOUNDARY SCAN HDB, P251

[7] A symbolic simulation-based ANSI/IEEE Std 1149.1 compliance checker and BSDL generator [J].

Singh, H ;

Patankar, G ;

Beausang, J .

ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY, 1997, :256-264

[8]

*TIA EIA, 1996, TIAEIA6441996

[9]

Whetsel L, 1995, PROCEEDINGS - INTERNATIONAL TEST CONFERENCE 1995, P851, DOI 10.1109/TEST.1995.529917

← 1 →