The effect of negative feedback on single event transient propagation in digital circuits

被引：14

作者：

Narasimham, Balaji ^{[1
]}

Bhuva, Bharat L. ^{[1
]}

Holman, William T. ^{[1
]}

Schrimpf, Ronald D. ^{[1
]}

Massengill, Lloyd W. ^{[1
]}

Witulski, Arthur F. ^{[1
]}

Robinson, William H. ^{[1
]}

机构：

[1] Vanderbilt Univ, Dept Elect Engn & Comp Sci, Nashville, TN 37235 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2006年 / 53卷 / 06期

关键词：

critical charge; feedback; Miller effect; SER; SET; single event; soft error;

D O I：

10.1109/TNS.2006.885380

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Propagation and attenuation of Single Event Transient (SET) pulses in combinational logic circuits are examined. A Miller feedback mechanism that affects the minimum pulse width needed for SET propagation in combinational logic circuits is identified. Analytical models that are,commonly employed to predict the combinational Soft Error Rate (SER) of future integrated circuit (IC) technologies do not include this feed back effect. Inclusion of this effect increases the critical charge required for SET propagation through a combinational logic circuit by more than 30%. This feedback phenomenon reduces the estimated SER, which is sensitive to changes in critical charge, by more than 40%.

引用

页码：3285 / 3290

页数：6

共 13 条

[1] Baumann RC, 2005, P IEEE NUCL SPAC RAD
[2] Attenuation of single event induced pulses in CMOS combinational logic
Baze, MP
Buchner, SP
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) : 2217 - 2223
[3] Bellido-Díaz MJ, 2000, IEE P-CIRC DEV SYST, V147, P107, DOI 10.1049/ip-cds:20000197
[4] Buchner S., 2001, P IEEE NUCL SPAC RAD
[5] Impact of CMOS technology scaling on the atmospheric neutron soft error rate
Hazucha, P
Svensson, C
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2000, 47 (06) : 2586 - 2594
[6] Horowitz M. A., 1983, SEL83003 STANF U
[7] Massengill L., 1993, P IEEE NUCL SPAC RAD
[8] Soft error rate mitigation techniques for modern microcircuits
Mavis, DG
Eaton, PH
[J]. 40TH ANNUAL PROCEEDINGS: INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2002, : 216 - 225
[9] Crosstalk noise reduction in synthesized digital logic circuits
Milter, O
Kolodny, A
[J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2003, 11 (06) : 1153 - 1158
[10] Modeling the effect of technology trends on the soft error rate of combinational logic
Shivakumar, P
Kistler, M
Keckler, SW
Burger, D
Alvisi, L
[J]. INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS, PROCEEDINGS, 2002, : 389 - 398

← 1 2 →