Phase Noise Measurement on IF Analog Signals using Standard Digital ATE Resources

被引：0

作者：

David-Grignot, Stephane ^{[1
,2
]}

Azais, Florence ^{[1
]}

Latorre, Laurent ^{[1
]}

Lefevre, Francois ^{[2
]}

机构：

[1] Univ Montpellier 2, CNRS, LIRMM, F-34392 Montpellier, France

[2] NXP Semicond Caen, F-14000 Caen, France

来源：

2014 IEEE 12TH INTERNATIONAL NEW CIRCUITS AND SYSTEMS CONFERENCE (NEWCAS) | 2014年

关键词：

noise measurement; phase noise; analog signals; time-domain analysis; one bit acquisition; digital signal processing; ATE; test cost reduction;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper introduces a low-cost technique for phase noise measurement on IF analog signals. The technique is based on signal acquisition from a digital Automated Test Equipment (ATE) and a dedicated post-processing algorithm that permits to reconstruct the time-domain phase of the IF analog signal from the digital capture. An experimental setup is developed to validate the proposed technique and measurements on actual analog signals demonstrate a very good agreement with conventional phase noise measurements.

引用

页码：121 / 124

页数：4

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