Estimating Specular Roughness and Anisotropy from Second Order Spherical Gradient Illumination

被引:55
作者
Ghosh, Abhijeet [1 ]
Chen, Tongbo [1 ]
Peers, Pieter [1 ]
Wilson, Cyrus A. [1 ]
Debevec, Paul [1 ]
机构
[1] Univ So Calif, Inst Creat Technol, Los Angeles, CA 90089 USA
关键词
APPEARANCE;
D O I
10.1111/j.1467-8659.2009.01493.x
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
This paper presents a novel method for estimating specular roughness and tangent vectors, per surface point, from polarized second order spherical gradient illumination patterns. We demonstrate that for isotropic BRDFs, only three second order spherical gradients are sufficient to robustly estimate spatially varying specular roughness. For anisotropic BRDFs, an additional two measurements yield specular roughness and tangent vectors per surface point. We verity our approach with different illumination configurations which project both discrete and continuous fields of gradient illumination. Our technique provides a direct estimate a the per-pixel specular roughness and thus does not require off-line numerical optimization that is typical for the measure-and-fit approach to classical BRDF modeling.
引用
收藏
页码:1161 / 1170
页数:10
相关论文
共 29 条
[1]  
ALLDRIN N, 2008, P IEEE COMP VIS PATT
[2]  
Alldrin NG, 2007, IEEE I CONF COMP VIS, P417
[3]  
[Anonymous], 1977, TECHNICAL REPORT
[4]  
[Anonymous], P 18 ANN C COMP GRAP
[5]  
[Anonymous], 2006, ACM T GRAPH
[6]  
[Anonymous], 1998, THESIS CORNELL U
[7]  
Ashikhmin M, 2000, COMP GRAPH, P65, DOI 10.1145/344779.344814
[8]  
ASHIKHMIN M, 2006, DISTRIBUTION BASED B
[9]  
Francken Y., 2008, Computer Vision and Pattern Recognition, P1
[10]   Linear light source reflectometry [J].
Gardner, A ;
Tchou, C ;
Hawkins, T ;
Debevec, P .
ACM TRANSACTIONS ON GRAPHICS, 2003, 22 (03) :749-758