High-temperature operation of InAs-GaAs quantum-dot infrared photodetectors with large responsivity and detectivity

被引:156
|
作者
Chakrabarti, S
Stiff-Roberts, AD
Bhattacharya, P [1 ]
Gunapala, S
Bandara, S
Rafol, SB
Kennerly, SW
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
[2] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
[3] USA, Res Lab, Sensors & Electron Devices Directorate, Adelphi, MD 20783 USA
关键词
detectivity; InAs-GaAs; infrared detector; quantum dots; responsivity;
D O I
10.1109/LPT.2004.825974
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have optimized the growth of multiple (40-70) layers of self-organized InAs quantum dots separated by GaAs barrier layers in order to enhance the absorption of quantum-dot infrared photodetectors (QDIPs). In devices with 70 quantum-dot layers, at relatively large operating biases (less than or equal to -1.0 V), the dark current density is as low as 10(-5) A/cm(2) and the peak responsivity ranges from similar to0.1 to 0.3 A/W for temperatures T = 150 K - 175 K. The peak detectivity corresponding to these low dark currents and high responsivities varies in the range 6 x 10(9) less than or equal to D-* (cm . Hz(1/2)/W) less than or equal to 10(11) for temperatures 100 less than or equal to T(K) less than or equal to 200. These performance characteristics represent the state-of-the-art for QDIPs and indicate that this device heterostructure is appropriate for incorporation into focal plane arrays.
引用
收藏
页码:1361 / 1363
页数:3
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