Industrial Remaining Useful Life Prediction by Partial Observation Using Deep Learning With Supervised Attention

被引:45
作者
Li, Xiang [1 ]
Jia, Xiaodong [1 ]
Wang, Yinglu [1 ]
Yang, Shaojie [1 ]
Zhao, Haodong [2 ]
Lee, Jay [1 ]
机构
[1] Univ Cincinnati, Dept Mech & Mat Engn, Cincinnati, OH 45221 USA
[2] Foxconn Technol Grp, Taipei, Taiwan
关键词
Wheels; Degradation; Deep learning; Prognostics and health management; Neural networks; Machinery; Industries; Attention mechanism; deep learning; industrial images; partial observation; prognostics and health management (PHM); remaining useful life prediction; FAULT-DIAGNOSIS; NETWORKS; MACHINE; STATE;
D O I
10.1109/TMECH.2020.2992331
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Effective and reliable machinery health assessment and prognostic methods have been highly demanded in modern industries. In the past years, promising prognostic results have been achieved by the intelligent data-driven approaches. However, the existing methods generally rely on the availability of the complete system information. In the real industries, due to practical restrictions of mechanical structure, sensor installation etc., the collected data may only cover partial system health information, which is denoted as partial observation problem. The existing data-driven methods are basically less effective in such scenarios with data incompleteness and disturbances. In order to address this issue, a deep learning-based remaining useful life prediction method is proposed in this article, where supervised attention mechanism is introduced. The informative data with more significant degradation features can be focused on for prognostics, and the data with nondiscriminative features can be ignored. A cutting wheel degradation image dataset is contributed to validate the proposed method, which is prepared from the real industrial manufacturing process. The experimental results suggest the proposed method offers an effective and promising approach on the prognostic problems with partial observations.
引用
收藏
页码:2241 / 2251
页数:11
相关论文
共 30 条
  • [1] [Anonymous], 2012, P IEEE C PROGN HLTH
  • [2] Long Short-Term Memory Networks for Accurate State-of-Charge Estimation of Li-ion Batteries
    Chemali, Ephrem
    Kollmeyer, Phillip J.
    Preindl, Matthias
    Ahmed, Ryan
    Emadi, Ali
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2018, 65 (08) : 6730 - 6739
  • [3] Remaining useful life predictions for turbofan engine degradation using semi-supervised deep architecture
    Ellefsen, Andre Listou
    Bjorlykhaug, Emil
    Aesoy, Vilmar
    Ushakov, Sergey
    Zhang, Houxiang
    [J]. RELIABILITY ENGINEERING & SYSTEM SAFETY, 2019, 183 : 240 - 251
  • [4] Graves A, 2012, STUD COMPUT INTELL, V385, P15
  • [5] Machinery health indicator construction based on convolutional neural networks considering trend burr
    Guo, Liang
    Lei, Yaguo
    Li, Naipeng
    Yan, Tao
    Li, Ningbo
    [J]. NEUROCOMPUTING, 2018, 292 : 142 - 150
  • [6] A recurrent neural network based health indicator for remaining useful life prediction of bearings
    Guo, Liang
    Li, Naipeng
    Jia, Feng
    Lei, Yaguo
    Lin, Jing
    [J]. NEUROCOMPUTING, 2017, 240 : 98 - 109
  • [7] Wind Turbine Fault Detection Using a Denoising Autoencoder With Temporal Information
    Jiang, Guoqian
    Xie, Ping
    He, Haibo
    Yan, Jun
    [J]. IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2018, 23 (01) : 89 - 100
  • [8] Deep Learning-Based Partial Domain Adaptation Method on Intelligent Machinery Fault Diagnostics
    Li, Xiang
    Zhang, Wei
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2021, 68 (05) : 4351 - 4361
  • [9] Deep Learning-Based Machinery Fault Diagnostics With Domain Adaptation Across Sensors at Different Places
    Li, Xiang
    Zhang, Wei
    Xu, Nan-Xi
    Ding, Qian
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2020, 67 (08) : 6785 - 6794
  • [10] Diagnosing Rotating Machines With Weakly Supervised Data Using Deep Transfer Learning
    Li, Xiang
    Zhang, Wei
    Ding, Qian
    Li, Xu
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS, 2020, 16 (03) : 1688 - 1697