共 11 条
Bright CdSe quantum dot inserted in single ZnSe nanowires
被引:2
作者:
Tribu, A.
[1
]
Sallen, G.
[2
]
Aichele, T.
[1
]
Bougerol, C.
[2
]
Andre, R.
[2
]
Poizat, J. P.
[2
]
Tatarenko, S.
[2
]
Kheng, K.
[1
]
机构:
[1] CEA INAC SP2M, CEA CNRS, Grp Nanophys & Semicond, F-38054 Grenoble, France
[2] Univ Grenoble 1, CNRS, Inst Neel, F-38042 Grenoble, France
关键词:
Single nanowire;
Two-step process;
CdSe;
ZnSe;
Single nanowire heterostructures;
Single NW;
Single QD;
Single quantum dot;
Polarisation;
Antibunching;
Correlation measurement;
Micro photoluminescence;
mu PL;
Time-resolved photoluminescence;
TRPL;
PHOTOLUMINESCENCE;
PHOTODETECTION;
D O I:
10.1016/j.mejo.2008.07.045
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
We report the evidence of CdSe quantum dot (QD) insertion in single defect-free ZnSe nanowire. These nanowires have been grown by molecular beam epitaxy in vapour-liquid-solid growth mode catalysed with gold particles. We developed a two-step process allowing us to grow very thin (from 15 to 5 nm) defect-free ZnSe nanowire on top of a nanoneedle, where all defects are localised. The CdSe QDs are incorporated to the defect-free nanowires part. Owing to the extraction efficiency of the nanowires and the reduced number of stacking fault defects in the two-step-process nanowires, a very efficient photoluminescence is observed even on isolated single nanowire. Time-resolved photoluminescence and correlation photon give evidences that the bright photon emission is related to the CdSe QD. (C) 2008 Elsevier Ltd. All rights reserved.
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页码:253 / 255
页数:3
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