Comparison of different methodologies for parameter extraction in circuit design

被引：0

作者：

Anile, A. M. ^{[1
]}

Rinaudo, S. ^{[2
]}

Ciccazzo, A. ^{[2
]}

Martino, V. Cinnera ^{[2
]}

Milazzo, C. ^{[1
]}

Spinella, S. ^{[3
]}

机构：

[1] Catania Univ, Dipartimento Matemat & Informat, Viale A Doria 6, Catania, Italy

[2] ST Microelect, Catania 95121, Italy

[3] Univ Calabria, Dept Linguist, I-87030 Commenda Di Rende, Italy

来源：

SCIENTIFIC COMPUTING IN ELECTRICAL ENGINEERING | 2006年 / 9卷

关键词：

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

This preliminary work concerns parameter extraction for electronic device circuit models. The reliability of electronic circuit design simulators depends crucially on the validity of the parameters which appear in the circuit models. These parameters must fit the measurements of a real device and measured data not be to sensitive to small data perturbation (robustness). We compare standard fitting techniques and possible alternatives in order to investigate the connection between fitting and robustness in parameter extraction.

引用

页码：283 / +

页数：2