Complex transmittance gratings based on subwavelength metallic structures

被引：1

作者：

Vincent, G. ^{[1
]}

Haidar, R. ^{[1
]}

Collin, S. ^{[1
]}

Cambril, E. ^{[1
]}

Velghe, S. ^{[1
]}

Primot, J. ^{[1
]}

Pardo, F. ^{[1
]}

Pelouard, J. -L. ^{[1
]}

机构：

[1] Onera, F-91761 Palaiseau, France

来源：

NANOPHOTONICS-USA | 2006年 / 6195卷

关键词：

gratings; transmittance; subwavelength; waveguide;

D O I：

10.1117/12.668533

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Subwavelength metallic structures are used to design gratings with a great variety of transmittance levels. Such gratings can answer growing needs for complex transmittance devices, particularly useful for wave-front analysis applications. Having in mind the conception of a perfectly sinusoidal transmittance for the mid-infrared, we have decided to test the ability of subwavelength lamellar gratings to code the transmittance with several levels. In order to calibrate gratings transmission, as a function of the fill factor, we have designed, realized and measured samples made of six 2mm x 2mm gratings, with transmittance ranging from 10% to 95%. Experimental results for TM- and TE-polarized light are reported and analysed.

引用

页数：12

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