Fourier-based object description in defect image retrieval

被引:14
作者
Kunttu, Iivari
Lepisto, Leena
Rauhamaa, Juhani
Visa, Ari
机构
[1] Tampere Univ Technol, Inst Signal Proc, FIN-33101 Tampere, Finland
[2] ABB Oy, Proc Ind, Helsinki 00381, Finland
关键词
object description; shape classification; Fourier descriptor; defect image retrieval;
D O I
10.1007/s00138-006-0030-6
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Image retrieval has nowadays several industrial applications. In these imaging applications, which typically use large image archives, the matter of computational efficiency is essential. Therefore, compact and efficient features are required to describe the visual content of the images. In this paper, we introduce a new Fourier-based object descriptor that combines the shape and color information of the objects occurring in images into a single low-dimensional descriptor. The experiments performed with an industrial surface defect image database show that the proposed descriptor is an accurate and computationally light approach to object description in a real-world retrieval problem.
引用
收藏
页码:211 / 218
页数:8
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