Bending strain-tunable magnetic anisotropy in Co2FeAl Heusler thin film on Kapton®

被引：44

作者：

Gueye, M. ^{[1
]}

Wague, B. M. ^{[1
]}

Zighem, F. ^{[1
]}

Belmeguenai, M. ^{[1
]}

Gabor, M. S. ^{[2
]}

Petrisor, T., Jr. ^{[2
]}

Tiusan, C. ^{[2
]}

Mercone, S. ^{[1
]}

Faurie, D. ^{[1
]}

机构：

[1] Univ Paris 13, CNRS, Sorbonne Paris Cite, Lab Sci Proc & Mat, F-93430 Villetaneuse, France

[2] Tech Univ Cluj Napoca, Ctr Superconduct Spintron & Surface Sci, RO-400114 Cluj Napoca, Romania

来源：

APPLIED PHYSICS LETTERS | 2014年 / 105卷 / 06期

关键词：

X-RAY;

D O I：

10.1063/1.4893157

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Bending effect on the magnetic anisotropy in 20 nm Co2FeAl Heusler thin film grown on Kapton (R) has been studied by ferromagnetic resonance and glued on curved sample carrier with various radii. The results reported in this Letter show that the magnetic anisotropy is drastically changed in this system by bending the thin films. This effect is attributed to the interfacial strain transmission from the substrate to the film and to the magnetoelastic behavior of the Co2FeAl film. Moreover, two approaches to determine the in-plane magnetostriction coefficient of the film, leading to a value that is close to lambda(CFA) 14 x 10(-6), have been proposed. (C) 2014 AIP Publishing LLC.

引用

页数：4

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