Solution-processed indium-zinc-oxide thin-film transistors from a fast and stable pre-annealing process with a femtosecond laser

被引:0
作者
Shan, Fei [1 ]
Kim, Sung-Jin [1 ]
Zhao, Yu [2 ]
Kim, Nam [2 ]
Choi, Seong Gon [2 ]
Chang, Seung Wook [3 ]
机构
[1] Chungbuk Natl Univ, Coll Elect & Comp Engn, Cheongju 28644, South Korea
[2] Chungbuk Natl Univ, Dept Informat & Commun Engn, Cheongju 28644, South Korea
[3] Samsung Display Co Ltd, R&D Ctr, Yongin 17113, South Korea
基金
新加坡国家研究基金会;
关键词
IZO thin-film transistor; Femtosecond laser; Solution-processed; Pre-annealing; RESIDUAL-STRESS; SILICON; MOBILITY; GROWTH;
D O I
10.3938/jkps.70.872
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A pre-annealing manufacturing process is applied to enhance the electrical characteristics of solution-processed indium-zinc-oxide (IZO) thin-film transistors (TFTs). We show here a fast and stable pre-annealing process using a femtosecond laser to maintain electrical stability and improve electrical performance. Furthermore, the femtosecond-laser pre-annealing process is a fast preparation method that has greater flexibility and development space for semiconductor production activity. Pre-annealed IZO TFTs show a field-effect mobility of 3.75 cm(2)/Vs, an on-current/off-current (I (on) /I (off) ) ratio greater than 10(5), a threshold voltage of 1.13 V, and a subthreshold swing of 1.21 V/dec. Moreover, the femtosecond laser pre-annealing, which provides better electrical stability in the solution-processed IZO TFTs, is discussed.
引用
收藏
页码:872 / 875
页数:4
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