Solution-processed indium-zinc-oxide thin-film transistors from a fast and stable pre-annealing process with a femtosecond laser

被引:0
|
作者
Shan, Fei [1 ]
Kim, Sung-Jin [1 ]
Zhao, Yu [2 ]
Kim, Nam [2 ]
Choi, Seong Gon [2 ]
Chang, Seung Wook [3 ]
机构
[1] Chungbuk Natl Univ, Coll Elect & Comp Engn, Cheongju 28644, South Korea
[2] Chungbuk Natl Univ, Dept Informat & Commun Engn, Cheongju 28644, South Korea
[3] Samsung Display Co Ltd, R&D Ctr, Yongin 17113, South Korea
基金
新加坡国家研究基金会;
关键词
IZO thin-film transistor; Femtosecond laser; Solution-processed; Pre-annealing; RESIDUAL-STRESS; SILICON; MOBILITY; GROWTH;
D O I
10.3938/jkps.70.872
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
A pre-annealing manufacturing process is applied to enhance the electrical characteristics of solution-processed indium-zinc-oxide (IZO) thin-film transistors (TFTs). We show here a fast and stable pre-annealing process using a femtosecond laser to maintain electrical stability and improve electrical performance. Furthermore, the femtosecond-laser pre-annealing process is a fast preparation method that has greater flexibility and development space for semiconductor production activity. Pre-annealed IZO TFTs show a field-effect mobility of 3.75 cm(2)/Vs, an on-current/off-current (I (on) /I (off) ) ratio greater than 10(5), a threshold voltage of 1.13 V, and a subthreshold swing of 1.21 V/dec. Moreover, the femtosecond laser pre-annealing, which provides better electrical stability in the solution-processed IZO TFTs, is discussed.
引用
收藏
页码:872 / 875
页数:4
相关论文
共 50 条
  • [1] Solution-processed indium-zinc-oxide thin-film transistors from a fast and stable pre-annealing process with a femtosecond laser
    Fei Shan
    Sung-Jin Kim
    Yu Zhao
    Nam Kim
    Seong Gon Choi
    Seung Wook Chang
    Journal of the Korean Physical Society, 2017, 70 : 872 - 875
  • [2] Effects of Pre-annealing on the Performance of Solution-processed Indium Zinc Oxide Thin-film Transistors
    Shan, Fei
    Kim, Sung-Jin
    JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2018, 18 (03) : 315 - 320
  • [3] Pre-Annealing Effect for Low-Temperature, Solution-Processed Indium Oxide Thin-Film Transistors
    Kang, Chan-Mo
    Kim, Hoon
    Oh, Yeon-Wha
    Baek, Kyu-Ha
    Do, Lee-Mi
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2017, 17 (05) : 3293 - 3297
  • [4] Replacement and Rearrangement of an Oxide Lattice by Germanium Doping in Solution-Processed Indium-Zinc-Oxide Thin-Film Transistors
    Jung, Tae Soo
    Kim, Si Joon
    Kim, Chul Ho
    Jung, Joohye
    Na, Jaewon
    Sabri, Mardhiah Muhamad
    Kim, Hyun Jae
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2015, 62 (09) : 2888 - 2893
  • [5] Importance of Solvent Evaporation Temperature in Pre-Annealing Stage for Solution-Processed Zinc Tin Oxide Thin-Film Transistors
    Jeon, Sang-Hwa
    Wang, Ziyuan
    Seo, Kyeong-Ho
    Feng, Junhao
    Zhang, Xue
    Park, Jaehoon
    Bae, Jin-Hyuk
    ELECTRONICS, 2022, 11 (18)
  • [6] Achieving High-Performance Solution-Processed Thin-Film Transistors by Doping Strong Reducibility Element Into Indium-Zinc-Oxide
    Cao, Jifang
    Liu, Dong
    Xia, Wentai
    Liu, Fei
    Chen, Bing
    IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2023, 11 : 406 - 410
  • [7] Reduction of Hysteresis in Solution-Processed InGaZnO Thin-Film Transistors through Uni-Directional Pre-Annealing
    Kim, Young-Rae
    Kwon, Jin-Hyuk
    Vincent, Premkumar
    Kim, Do-Kyung
    Jeong, Hyeon-Seok
    Hahn, Joonku
    Bae, Jin-Hyuk
    Park, Jaehoon
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2018, 72 (02) : 270 - 275
  • [8] Reduction of hysteresis in solution-processed InGaZnO thin-film transistors through uni-directional pre-annealing
    Young-Rae Kim
    Jin-Hyuk Kwon
    Premkumar Vincent
    Do-Kyung Kim
    Hyeon-Seok Jeong
    Joonku Hahn
    Jin-Hyuk Bae
    Jaehoon Park
    Journal of the Korean Physical Society, 2018, 72 : 270 - 275
  • [9] TiOx-based thin-film transistors prepared by femtosecond laser pre-annealing
    Shan, Fei
    Kim, Sung-Jin
    SOLID-STATE ELECTRONICS, 2018, 140 : 86 - 89
  • [10] Inert Gas Annealing Effect in Solution-Processed Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistors
    Lee, Seungwoon
    Jeong, Jaewook
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2017, 71 (04) : 209 - 214