Thickness dependent optical dispersion parameters and nonlinear optical properties of nanostructured Cr doped CdO thin films

被引:12
作者
Hymavathi, B. [1 ]
Kumar, B. Rajesh [2 ]
Rao, T. Subba [3 ]
机构
[1] Anil Neerukonda Inst Technol & Sci Autonomous, Dept Phys, Visakhapatnam 531162, Andhra Pradesh, India
[2] GITAM Univ, GITAM Inst Technol, Dept Phys, Visakhapatnam 530045, Andhra Pradesh, India
[3] Sri Krishnadevaraya Univ, Dept Phys, Anantapur 515003, Andhra Pradesh, India
关键词
Thin films; DC magnetron sputtering; Dispersion parameters; Dielectric constants; Nonlinear refractive index; PULSED-LASER DEPOSITION; SPRAY-PYROLYSIS; SEMICONDUCTORS; CONSTANTS; BEHAVIOR;
D O I
10.1007/s11082-017-0935-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Cr doped CdO thin films were deposited on glass substrates by reactive DC magnetron sputtering with varying film thickness from 250 to 400 nm. XRD studies reveal that the films exhibit cubic structure with preferred orientation along the (2 0 0) plane. The optical transmittance of the films decreases from 92 to 72%, whereas the optical energy band gap of the films decreased from 2.88 to 2.78 eV with increasing film thickness. The Wemple-DiDomenico single oscillator model has been used to evaluate the optical dispersion parameters such as dispersion energy (E-d), oscillator energy (E-o), static refractive index (n(o)) and high frequency dielectric constant (epsilon(infinity)). The nonlinear optical parameters such as optical susceptibility (chi(()1)), third order nonlinear optical susceptibility (chi((3))) and nonlinear refractive index (n(2)) of the films were also determined.
引用
收藏
页数:13
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