Epitaxial growth of GaN on single-crystal Mo substrates using HfN buffer layers

被引:18
|
作者
Okamoto, Koichiro [1 ]
Inoue, Shigeru [2 ]
Nakano, Takayuki [2 ]
Ohta, Jitsuo [1 ,2 ]
Fujioka, Hiroshi [1 ,2 ,3 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
[2] KAST, Takatsu Ku, Kawasaki, Kanagawa 2130012, Japan
[3] Japan Sci & Technol Agcy, CREST, Chiyoda Ku, Tokyo 1020075, Japan
关键词
Structural properties; Epitaxy; Gallium nitride; Hafnium nitride; Molybdenum; ALN FILMS; STRUCTURAL-PROPERTIES; ORIENTATION; REFLECTION; JUNCTIONS; ELECTRODE; SURFACES; ENERGY;
D O I
10.1016/j.jcrysgro.2008.11.097
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaN films have been grown on single-crystalline Mo substrates using lattice-matched HfN buffer layers, and their structural properties have been investigated. Although it is not possible to grow high-quality GaN films on either Mo(110) or (111) substrates, high-quality epitaxial GaN(0001) films with atomically flat surfaces can be grown on the HfN(111)/Mo(110) structure with an in-plane alignment of GaN[11 (2) over bar0] parallel to HfN[1 (1) over bar0] parallel to Mo[001]. We have also found that the HfN/Mo heterointerface is quite abrupt. These results indicate that Mo(110) substrates with HfN buffer layers are promising candidates for the fabrication of future light-emitting devices (LEDs). (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:1311 / 1315
页数:5
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