TESTING SYSTEM FOR ANALOG DEVICES DIRECT DIGITAL SYNTHESIZER

被引：3

作者：

Loskutov, Ilia ^{[1
]}

Shvetsov-Shilovskiy, Ivan ^{[1
]}

Boychenko, Dmitry ^{[1
]}

机构：

[1] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow 115409, Russia

来源：

VII SCIENTIFIC CONFERENCE WITH INTERNATIONAL PARTICIPATION INFORMATION-MEASURING EQUIPMENT AND TECHNOLOGIES (IME&T 2016) | 2016年 / 79卷

关键词：

IMPLEMENTATION;

D O I：

10.1051/matecconf/20167901015

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.

引用

页数：6

共 15 条

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