Random stopping power and energy straggling of 16O ions into amorphous Si target

被引:11
作者
Araujo, LL [1 ]
Grande, PL [1 ]
Behar, M [1 ]
dos Santos, JHR [1 ]
机构
[1] Univ Fed Rio Grande Sul, Inst Fis, Porto Alegre, RS, Brazil
关键词
stopping power; energy loss; RBS; energy straggling; oxygen; silicon;
D O I
10.1016/S0168-583X(01)01174-0
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In the present contribution, we report results on random stopping power and range straggling of O-16 ions into amorphous Si target. The measurements were performed in a 300 keV-13.5 MeV energy interval by using the Rutherford backscattering technique together with a marker system. The present stopping results were compared with the TRIM predictions based on the Ziegler, Biersack and Littmark calculations, the theoretical values being always higher than the experimental ones. On the other hand, the calculated straggling data are compared with the Bohr predictions. For low energies, the calculated values over-estimate the experimental ones. For energies larger than 2 MeV, the experimental results became larger than the Bohr predictions. However, with increasing energies, the experimental results approach the Bohr values, and above 12 MeV a quite good theoretical experimental agreement was found. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:79 / 83
页数:5
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