Atomic Perspectives Single-Particle ICP-MS: A Key Analytical Technique for Characterizing Nanoparticles

被引:0
|
作者
Stephan, Chady [1 ]
Thomas, Robert [2 ]
机构
[1] PerkinElmer Inc, Waltham, MA 02451 USA
[2] Sci Solut, Washington, DC USA
关键词
PLASMA-MASS SPECTROMETRY; NANOSILVER;
D O I
暂无
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
The National Nanotechnology Initiative defines engineered nanomaterials (ENM) as those with dimensions of 1-100 nm, where their unique characteristics enable novel applications to be carried out. ENMs often possess different properties than their bulk counterparts of the same composition, making them of great interest for a broad spectrum of industrial, commercial, and healthcare uses. However, the widespread application of ENMs will inevitably lead to their release into the environment, which raises concerns about their potential adverse effects on the ecosystems and their impact on human health.
引用
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页码:12 / 25
页数:14
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