Investigations on Charge Trapping and De-trapping Properties of Polymeric Insulators through Discharge Current Measurements

被引:10
作者
Haque, N. [1 ]
Dalai, S. [1 ]
Chatterjee, B. [1 ]
Chakravorti, S. [1 ]
机构
[1] Jadavpur Univ, Dept Elect Engn, Kolkata 700032, India
关键词
Charge trapping; de-trapping; discharge current; image charge; trap depth; polymeric insulators; POLYETHYLENE; DEGRADATION; TRANSPORT; MODELS;
D O I
10.1109/TDEI.2016.006154
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is generally accepted that formation and accumulation of space charge in polymeric insulation is a critical issue in the design of high voltage electric systems, as it leads to insulation degradation and premature failure under high voltage surges and polarity reversals. Even at service stress level, accumulation of space charge may cause electro-thermal aging. The insulation degradation and aging is reflected in the trapping and de-trapping characteristics of the insulation, making it a useful aging marker. Space charge measurement methods are frequently used for trapping and de-trapping analysis. However, estimation of charge trapping and de-trapping behavior is very difficult due to the involvement of material properties and also partly due to the fact that proper measurement of space charge is itself a very complicated issue, requiring very sophisticated experimental arrangement and signal processing techniques. Moreover, application of these methods is limited to polymeric insulations of certain geometries (planar or radial). In this paper, the charge trapping and de-trapping behavior of low density polyethylene (LDPE), a widely used polymeric material for electrical insulation purpose, have been investigated employing a direct method based on the discharge characteristics obtained after the sample was stressed for short durations. A relationship is established between the de-trapped charge and the extracted charge measured from the discharge current. From this relationship a relative distribution of trapped charges across different trap depths was obtained. It was noticed that the trapped charge distribution is of exponential nature in the trap depth range of 0.93-1.11 eV. The presented method facilitates direct estimation of trap distribution independent of the insulation geometry. It was also observed that the trapped charge is highly dependent on the applied field.
引用
收藏
页码:583 / 591
页数:9
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