A physics-based analytic solution to the MOSFET surface potential from accumulation to strong-inversion region

被引:45
|
作者
He, Jin [1 ]
Chan, Mansun
Zhang, Xing
Wang, Yangyuan
机构
[1] Peking Univ, Sch Elect Engn & Comp Sci, Inst Microelect, Nanoscale Device & Circuit Grp, Beijing 100871, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Elect & Elect Engn, Kowloon, Hong Kong, Peoples R China
关键词
analytic solution; compact modeling; MOSFETs; surface potential;
D O I
10.1109/TED.2006.880364
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A physics-based analytic solution to the surface potential from the accumulation to the strong-inversion region has been derived from the complete MOSFET surface potential equation in this paper without any need for smooth functions or simplification by dropping some second-order related terms. Its high accuracy in predicting the surface potential and the transcapacitance under various bias conditions has also been verified by a comparison with the numerical results. The explicit surface potential solution not only leads to a more clear understanding of MOSFET device physics but also provides a better platform to develop the advanced surface potential-based model for the circuit simulation.
引用
收藏
页码:2008 / 2016
页数:9
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