Polarization effects in nitride semiconductor device structures and performance of modulation doped field effect transistors

被引:84
作者
Morkoç, H
Cingolani, R
Gil, B
机构
[1] Virginia Commonwealth Univ, Coll Engn, Richmond, VA 23284 USA
[2] Univ Montpellier 2, F-34095 Montpellier 5, France
[3] Univ Lecce, Dept Mat Sci, I-73100 Lecce, Italy
关键词
D O I
10.1016/S0038-1101(99)00146-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Wide bandgap nitride semiconductors have recently attracted a great level of attention owing to their direct bandgaps in the visible to ultraviolet regions of the spectrum as emitters and detectors. Moreover, this material system with its favorable hetero-junctions and transport properties began to produce very respectable power levels in microwave amplifiers. If and when the breakdown fields achieved experimentally approach the predicted values, this material system would also be very attractive for power switching devices. In addition to the premature breakdown, and high concentration of defects and inhomogeneities, a number of scientific challenges remain including a clear experimental investigation of polarization effects. In this paper, following a succinct review of the progress that has been made, spontaneous and piezoelectric polarization effects and their impact on sample device like hetero-structures will be treated. (C) 1999 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1909 / 1927
页数:19
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