Electron-impact ionization of Se3+

被引：9
作者：
Alna'washi, G. A. [1 ,2 ]
Baral, K. K. [1 ]
Aryal, N. B. [1 ]
Thomas, C. M. [1 ]
Phaneuf, R. A. [1 ]
机构：
[1] Univ Nevada, Reno, NV 89557 USA
[2] Hashemite Univ, Zarqa 13115, Jordan
来源：
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS | 2014年 / 47卷 / 10期
关键词：
electron impact; ionization; cross section; selenium ions; animated beams technique;
D O I：
10.1088/0953-4075/47/10/105201
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Absolute electron-impact single and multiple ionization cross-section measurements for Se3+ ions were performed using the dynamic-crossed-beams technique over the energy range from the ionization threshold to 1 keV. The experimental single ionization cross section for Se3+ shows evidence of significant contributions of 4s-nl (n >= 6) and 3d-nl (n >= 4) inner-shell excitation-autoionization. The cross sections for double and triple ionization are dominated by ionization-autoionization and ionization-double autoionization of a 3p or 3s electron, respectively. The measurements were compared with the direct ionization cross sections predicted by the Lotz semi-empirical formula for direct ionization. The maximum values of cross sections for single, double, and triple ionization are compared.
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页数：7
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