Grazing-incidence electron microscopy of surface blisters in single- and polycrystalline tungsten formed by H+, D+ and He+ irradiation

被引:59
作者
Enomoto, Naruaki [1 ]
Muto, Shunsuke [1 ]
Tanabe, Tetsuo [2 ]
Davis, J. W. [3 ]
Haasz, A. A. [3 ]
机构
[1] Nagoya Univ, Dept Mat Phys & Energy Engn, Grad Sch Engn, Chikusa Ku, Aichi 4648603, Japan
[2] Kyushu Univ, Dept Adv Energy Engn Sci, Fukuoka 8128581, Japan
[3] Univ Toronto, Inst Aerosp Studies, Toronto, ON M3H 5T6, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
DEUTERIUM RETENTION; LOW-ENERGY; MECHANICAL-PROPERTIES; THERMAL-DESORPTION; ION-IRRADIATION; HELIUM; HYDROGEN; DEPENDENCE; IMPURITIES; RELEASE;
D O I
10.1016/j.jnucmat.2009.01.298
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Blisters on single- and polycrystalline tungsten surfaces formed by hydrogen and helium ion irradiation were investigated by grazing-incidence electron microscopy (GIEM) with an ultra-high-voltage transmission electron microscope. It was found that the blister skin thickness formed by D+ irradiation of polycrystalline tungsten (PCW) was considerably larger than the calculated ion range of the implants; however, this skin thickness (or blister depth) is not related to the pre-existing grain boundaries in the PCW. Blister formation was also observed with GIEM for single crystal tungsten (SCW) irradiated with H+, D+, and He+. The critical ion fluence for blister formation in SCW is estimated to be similar to 10(23) H+(D+)/m(2) for H(D) and similar to 10(21) He+/m(2) for He. The size of the blisters and their skin structure depends on the irradiating conditions. Typical skin thickness was about 50-150 nm. Based on the assumption that gas particles (H-2, D-2, and He) accumulate within the blisters during H+, D+, and He+ irradiation, the GIEM measurements provide a means to derive an estimate of the amount of gas so accumulated, by reproducing the observed blister shapes with finite element method (FEM) calculations. From the GIEM images and FEM calculations we have estimated the number of implanted ions being retained in the blisters, and compared these amounts with published retention measurements. A mechanism for the blister formation is proposed based on the present results. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:606 / 614
页数:9
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