Saturated structured confocal microscopy with theoretically unlimited resolution

被引：25

作者：

Haeberle, Olivier ^{[1
]}

Simon, Bertrand ^{[1
]}

机构：

[1] Univ Haute Alsace, Lab MIPS, EA2332, F-68093 Mulhouse, France

来源：

OPTICS COMMUNICATIONS | 2009年 / 282卷 / 18期

关键词：

Point spread function engineering; Fluorescence microscopy; Image formation; PATTERNED EXCITATION MICROSCOPY; POINT-SPREAD FUNCTIONS; FLUORESCENCE MICROSCOPY; AZIMUTHAL POLARIZATION; LATERAL RESOLUTION; PRACTICAL APPROACH; STRATIFIED MEDIUM; LIGHT; LOCALIZATION; ENHANCEMENT;

D O I：

10.1016/j.optcom.2009.06.025

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The resolution of fluorescence microscopes is limited by diffraction, which determines the extension of their point spread functions. We propose and study numerically a simple method, based on a combination of subtraction microscopy with regular and annular excitation beams, which permits to double the resolution compared to wide field microscopy. When combined with the fluorescence saturation phenomenon, this approach would be able to deliver a resolution of a few tens of nanometers. (c) 2009 Elsevier B.V. All rights reserved.

引用

页码：3657 / 3664

页数：8

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