Development of X-ray-induced afterglow characterization system

被引：501
作者：
Yanagida, Takayuki [1 ]
Fujimoto, Yutaka [1 ]
Ito, Takashi [2 ]
Uchiyama, Koro [2 ]
Mori, Kuniyoshi [2 ]
机构：
[1] Kyushu Inst Technol, Kitakyushu, Fukuoka 8080196, Japan
[2] Hamamatsu Photon Corp, Hamamatsu, Shizuoka 4308587, Japan
来源：
APPLIED PHYSICS EXPRESS | 2014年 / 7卷 / 06期
关键词：
SCINTILLATORS; ER3+; ND3+; TM3+; EMISSION; CRYSTALS; DETECTOR;
D O I：
10.7567/APEX.7.062401
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
To evaluate the X-ray-induced afterglow phenomenon, we developed an ionizing-radiation-induced luminescence characterization system equipped with a pulse-width-tunable X-ray source. The system consists of a pulse X-ray tube and a detector system based on photon counting. The excitation pulse width was tunable from nano- to millisecond ranges, and the dynamic range of the X-ray-induced afterglow was 10(6). Conventional scintillators for X-ray CT or security systems, namely, Bi4Ge3O12, CdWO4, TI-doped Csl, and Tb and Pr-codoped Gd2O2S, were evaluated for the performance test. Results show that the afterglow time profiles of these scintillators are consistent with generally known results with high accuracy. (C) 2014 The Japan Society of Applied Physics
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页数：3
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