Swift heavy ion induced modification of Si/C60 multilayers

被引：0
|
作者：
Srivastava, SK
Kabiraj, D
Schattat, B
Carstanjen, HD
Avasthi, DK
机构：
[1] Max Planck Inst Met Res, D-70569 Stuttgart, Germany
[2] Nucl Sci Ctr, New Delhi 110067, India
[3] Univ Stuttgart, Inst Strahlenphys, D-70569 Stuttgart, Germany
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2004年 / 219卷
关键词：
SHI; thermal spike; SiC; HRBS;
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Modifications induced by 120 and 350 MeV An ions at the interfaces of a Si/C-60 multilayer system have been investigated. High resolution Rutherford backscattering spectrometry using 2 MeV N+ ions and detecting N3+ backscatters from Si was performed for characterization. A significant smearing out of the peaks as a consequence of mixing of Si and C atoms across the interfaces is observed, which increases noticeably with depth. The amount of mixing for 350 MeV ions is found to be higher than that for 120 MeV ions and is, thus, dependent on the electronic energy deposited in the samples. The mixing has been inferred to be a result of interdiffusion in a transient molten state. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：815 / 819
页数：5
相关论文
共 50 条
  • [1] Swift heavy ion induced modification of C60 thin films
    Bajwa, N
    Dharamvir, K
    Jindal, VK
    Ingale, A
    Avasthi, DK
    Kumar, R
    Tripathi, A
    JOURNAL OF APPLIED PHYSICS, 2003, 94 (01) : 326 - 333
  • [2] Swift heavy ion-induced modification of metallic thin films and multilayers
    Gupta, A
    VACUUM, 2000, 58 (01) : 16 - 32
  • [3] Infrared studies of swift heavy ion irradiated C60 thin films
    Kumar, A
    Singh, F
    Avasthi, DK
    Pivin, JC
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 244 (01): : 221 - 224
  • [4] HUMIDITY AND TEMPERATURE SENSOR PROPERTIES OF p-Si/POLYIMIDE/C60 NANOSTRUCTURES WITH SWIFT HEAVY ION TRACKS
    Petrov, A. V.
    Kaniukov, E. Yu.
    Demyanov, S. E.
    Nocke, A.
    Guenther, M.
    Gerlach, G.
    Berdinsky, A. S.
    Fink, D.
    PHYSICS, CHEMISTRY AND APPLICATION OF NANOSTRUCTURES, 2009, : 628 - +
  • [5] Swift heavy ion induced modifications of optical and microstructural properties of silver-fullerene C60 nanocomposite
    Singhal, R.
    Agarwal, D. C.
    Mishra, Y. K.
    Mohapatra, S.
    Avasthi, D. K.
    Chawla, A. K.
    Chandra, R.
    Pivin, J. C.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2009, 267 (8-9): : 1349 - 1352
  • [6] Role of electron energy loss in modification of C60 thin films by swift heavy ions
    Bajwa, Navdeep
    Ingale, Alka
    Avasthi, D. K.
    Kumar, Ravi
    Tripathi, A.
    Dharamvir, Keya
    Jindal, V. K.
    JOURNAL OF APPLIED PHYSICS, 2008, 104 (05)
  • [7] Swift heavy ion irradiation and annealing effects in Fe/Si multilayers
    Dhuri, Pratima
    Gupta, Ajay
    Chaudhari, S.M.
    Phase, D.M.
    Avasthi, D.K.
    Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 1999, 156 (01): : 148 - 152
  • [8] Swift heavy ion irradiation and annealing effects in Fe/Si multilayers
    Dhuri, P
    Gupta, A
    Chaudhari, SM
    Phase, DM
    Avasthi, DK
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 156 (1-4): : 148 - 152
  • [9] Swift heavy ion induced modification of the Co/Si interface; cobalt silicide formation
    Bhattacharya, D
    Srivastava, SK
    Sahoo, PK
    Principi, G
    Kabiraj, D
    Som, T
    Kulkarni, VN
    Avasthi, DK
    SURFACE & COATINGS TECHNOLOGY, 2002, 158 : 59 - 63
  • [10] Irradiation effect of swift heavy ions on C60 films
    Jin, YF
    Tian, HX
    Xie, EQ
    Liu, J
    Wang, ZG
    Sun, Y
    Zhu, ZY
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 193 : 288 - 293
12345