Valence band dispersion measurements of perovskite single crystals using angle-resolved photoemission spectroscopy

被引：32

作者：

Wang, Congcong ^{[1
]}

Ecker, Benjamin R. ^{[1
]}

Wei, Haotong ^{[2
]}

Huang, Jinsong ^{[2
]}

Meng, Jian-Qiao ^{[3
]}

Gao, Yongli ^{[1
]}

机构：

[1] Univ Rochester, Dept Phys & Astron, Rochester, NY 14627 USA

[2] Univ Nebraska, Dept Mech & Mat Engn, Lincoln, NE 68588 USA

[3] Cent S Univ, Sch Phys & Elect, Hunan Key Lab Super Microstruct & Ultrafast Proc, Changsha 410083, Hunan, Peoples R China

来源：

PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2017年 / 19卷 / 07期

基金：

美国国家科学基金会; 中国国家自然科学基金;

关键词：

LEAD HALIDE PEROVSKITES; SOLAR-CELLS; PHOTOVOLTAIC APPLICATIONS; ELECTRONIC-STRUCTURE; OPTICAL-PROPERTIES; IODIDE PEROVSKITE; CARRIER DIFFUSION; THIN-FILMS; CH3NH3PBX3; SEMICONDUCTORS;

D O I：

10.1039/c6cp07176g

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The electronic structure of a cleaved perovskite (CH3NH3PbBr3) single crystal was studied in an ultrahigh vacuum (UHV) system using angle-resolved photoemission spectroscopy (ARPES) and inverse photoelectron spectroscopy (IPES). Highly reproducible dispersive features of the valence bands were observed with symmetry about the Brillouin zone center and boundaries. The largest dispersion width was found to be similar to 0.73 eV and similar to 0.98 eV along the Gamma X and Gamma M directions, respectively. The effective mass of the holes was estimated to be similar to 0.59m(0). The quality of the surface was verified using atomic force microscopy (AFM) and scanning electron microscopy (SEM). The elemental composition was investigated using high resolution X-ray photoelectron spectroscopy (XPS). The experimental electronic structure shows a good agreement with the theoretical calculation.

引用

页码：5361 / 5365

页数：5

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