Another dimension in device characterization

被引：21

作者：

Anand, S ^{[1
]}

机构：

[1] Royal Inst Technol, Dept Elect, Lab Semicond Mat, S-16428 Kista, Sweden

来源：

IEEE CIRCUITS & DEVICES | 2000年 / 16卷 / 02期

关键词：

D O I：

10.1109/101.833030

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：12 / 18

页数：7

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