Characterization of Multicomponent Polymer Trilayers with Resonant Soft X-Ray Reflectivity

被引:19
作者
Ade, H. [1 ]
Wang, C. [1 ,2 ,3 ]
Garcia, A.
Yan, H. [1 ]
Sohn, K. E. [4 ]
Hexemer, A. [2 ]
Bazan, G. C. [3 ,4 ]
Nguyen, T. -Q. [3 ]
Kramer, E. J. [4 ,5 ]
机构
[1] NCSU, Dept Phys, Raleigh, NC 27695 USA
[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Adv Light Source, Berkeley, CA 94720 USA
[3] Univ Calif Santa Barbara, Dept Chem & Biochem, Santa Barbara, CA 93106 USA
[4] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[5] Univ Calif Santa Barbara, Dept Chem Engn, Santa Barbara, CA 93106 USA
基金
美国国家科学基金会;
关键词
interfaces; organic devices; resonance reflectivity; thin films; X-ray reflectivity; LIGHT-EMITTING-DIODES; ENERGY; TRANSMISSION; INTERFACES; SCATTERING; COPOLYMER; SPECTRA;
D O I
10.1002/polb.21730
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Resonant soft X-ray reflectivity (RSoXR) has been used to quantify the layer thicknesses and the interfacial widths of a single, complex thin film with three polymeric layers supported on an inorganic substrate. By adjusting the photon energy, the sensitivity to particular interfaces within the trilayer can be selectively enhanced. The results significantly improve and broaden the capabilities of RSoXR, which has previously only been demonstrated and used for bilayers on silicon substrates. The capability of RSoXR to characterize polymer trilayers was not readily predictable from prior bilayer results, as the RSoXR characterization of bilayers benefits from a strong X-ray reflection from the substrate that serves as a reference beam with which the reflections from the other interfaces interfere with. The impact of having the capability to investigate trilayers is exemplified by discussing the utility of RSoXR to characterize organic electronic light emitting multilayers. (C) 2009 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 47: 1291-1299, 2009
引用
收藏
页码:1291 / 1299
页数:9
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