Integrating 3D PIN Germanium Detectors with High-k ALD Fabricated Slot Waveguides

被引:0
|
作者
Naiini, Maziar M. [1 ]
Radamson, Henry H. [1 ]
Malm, Gunnar [1 ]
Ostling, Mikael [1 ]
机构
[1] KTH Royal Inst Technol, Sch Informat & Commun Technol, SE-164 Kista, Sweden
来源
2014 15TH INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (ULIS) | 2014年
关键词
CMOS technology; germanium photodetectors; optical interconnects; photonics integrated circuits(PIC); slot waveguides; silicon photonics; SILICON; PHOTODETECTOR;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel device technology for photonics integrated circuits (PICs) is presented. In this work germanium PIN photodetectors are embedded in back-end deposited high-k slot waveguides. The waveguides are fabricated using chemical vapor deposited amorphous silicon and atomic layer deposition of Al2O3 thin films. The germanium PIN stack is selectively grown on a bulk silicon substrate. The detectors are butt coupled to the slot waveguides. Using our selective germanium growth and interconnect technology we study a 3D multilayer photonic integration for CMOS back-end of the line (BEOL) process. Finally we demonstrate the fabrication of a photonic chip deploying this technology platform.
引用
收藏
页码:45 / 48
页数:4
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