Three-Qubit Randomized Benchmarking

被引:118
作者
McKay, David C. [1 ]
Sheldon, Sarah [1 ]
Smolin, John A. [1 ]
Chow, Jerry M. [1 ]
Gambetta, Jay M. [1 ]
机构
[1] IBM TJ Watson Res Ctr, Yorktown Hts, NY 10598 USA
关键词
Benchmarking; -; Errors;
D O I
10.1103/PhysRevLett.122.200502
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
As quantum circuits increase in size, it is critical to establish scalable multiqubit fidelity metrics. Here we investigate, for the first time, three-qubit randomized benchmarking (RB) on a quantum device consisting of three fixed-frequency transmon qubits with pairwise microwave-activated interactions (cross-resonance). We measure a three-qubit error per Clifford of 0.106 for all-to-all gate connectivity and 0.207 for linear gate connectivity. Furthermore, by introducing mixed dimensionality simultaneous RB-simultaneous one-and two-qubit RB-we show that the three-qubit errors can be predicted from the one-and two-qubit errors. However, by introducing certain coherent errors to the gates, we can increase the three-qubit error to 0.302, an increase that is not predicted by a proportionate increase in the one-and two-qubit errors from simultaneous RB. This demonstrates the importance of multiqubit metrics, such as three-qubit RB, on evaluating overall device performance.
引用
收藏
页数:6
相关论文
共 44 条
[1]   Improved simulation of stabilizer circuits [J].
Aaronson, S ;
Gottesman, D .
PHYSICAL REVIEW A, 2004, 70 (05) :052328-1
[2]  
[Anonymous], ARXIVQUANTPH9807006
[3]  
[Anonymous], ARXIV181004182
[4]   Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits [J].
Ballance, C. J. ;
Harty, T. P. ;
Linke, N. M. ;
Sepiol, M. A. ;
Lucas, D. M. .
PHYSICAL REVIEW LETTERS, 2016, 117 (06)
[5]   Superconducting quantum circuits at the surface code threshold for fault tolerance [J].
Barends, R. ;
Kelly, J. ;
Megrant, A. ;
Veitia, A. ;
Sank, D. ;
Jeffrey, E. ;
White, T. C. ;
Mutus, J. ;
Fowler, A. G. ;
Campbell, B. ;
Chen, Y. ;
Chen, Z. ;
Chiaro, B. ;
Dunsworth, A. ;
Neill, C. ;
O'Malley, P. ;
Roushan, P. ;
Vainsencher, A. ;
Wenner, J. ;
Korotkov, A. N. ;
Cleland, A. N. ;
Martinis, John M. .
NATURE, 2014, 508 (7497) :500-503
[6]   Fast Tunable Coupler for Superconducting Qubits [J].
Bialczak, R. C. ;
Ansmann, M. ;
Hofheinz, M. ;
Lenander, M. ;
Lucero, E. ;
Neeley, M. ;
O'Connell, A. D. ;
Sank, D. ;
Wang, H. ;
Weides, M. ;
Wenner, J. ;
Yamamoto, T. ;
Cleland, A. N. ;
Martinis, J. M. .
PHYSICAL REVIEW LETTERS, 2011, 106 (06)
[7]   Randomized Benchmarking and Process Tomography for Gate Errors in a Solid-State Qubit [J].
Chow, J. M. ;
Gambetta, J. M. ;
Tornberg, L. ;
Koch, Jens ;
Bishop, Lev S. ;
Houck, A. A. ;
Johnson, B. R. ;
Frunzio, L. ;
Girvin, S. M. ;
Schoelkopf, R. J. .
PHYSICAL REVIEW LETTERS, 2009, 102 (09)
[8]  
Chuang IL, 1997, J MOD OPTIC, V44, P2455, DOI 10.1080/095003497152609
[9]  
Consortium of California Herbaria, 2017, NON TRADITIONAL REF
[10]   Process verification of two-qubit quantum gates by randomized benchmarking [J].
Corcoles, A. D. ;
Gambetta, Jay M. ;
Chow, Jerry M. ;
Smolin, John A. ;
Ware, Matthew ;
Strand, Joel ;
Plourde, B. L. T. ;
Steffen, M. .
PHYSICAL REVIEW A, 2013, 87 (03)