New Design Algorithm of the Shewhart&CUSUM Chart for Monitoring Process Mean Shifts

被引：1

作者：

Yang, Mei ^{[1
]}

Wu, Zhang ^{[1
]}

机构：

[1] Nanyang Technol Univ, Div Syst & Engn Management, Singapore 639798, Singapore

来源：

2008 IEEE INTERNATIONAL CONFERENCE ON MANAGEMENT OF INNOVATION AND TECHNOLOGY, VOLS 1-3 | 2008年

关键词：

Quality control; statistical process control; control chart; CUSUM chart; loss function;

D O I：

10.1109/ICMIT.2008.4654527

中图分类号：

C93 [管理学];

学科分类号：

12 ; 1201 ; 1202 ; 120202 ;

摘要：

This article proposed an algorithm for the optimization design of the combined Shewhart chart and CUSUM chart ((X) over bar &CUSUM chart) that has been widely used in Statistical Process Control (SPC). The optimization design effectively improves the overall performance over the entire process shift range. A new feature pertaining to the exponential of the sample mean shift w is investigated to further enhance the detection effectiveness. Furthermore, a design table is provided to facilitate the designs of the (X) over bar &CUSUM charts.

引用

页码：1124 / 1128

页数：5

共 12 条

[1] Optimization design of a CUSUM control chart based on taguchi's loss function
Jiao, Jianxin Roger
Helo, Petri T.
[J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2008, 35 (11-12) : 1234 - 1243
[2] COMBINED SHEWHART-CUSUM QUALITY-CONTROL SCHEMES
LUCAS, JM
[J]. JOURNAL OF QUALITY TECHNOLOGY, 1982, 14 (02) : 51 - 59
[3] Montgomery DC, 2019, INTRO STAT QUALITY C
[4] Comparisons of some exponentially weighted moving average control charts for monitoring the process mean and variance
Reynolds, Marion R., Jr.
Stoumbos, Zachary G.
[J]. TECHNOMETRICS, 2006, 48 (04) : 550 - 567
[5] REYNOLDS MR, 1990, TECHNOMETRICS, V32, P371, DOI 10.2307/1270114
[6] Should observations be grouped for effective process monitoring?
Reynolds, MR
Stoumbos, ZG
[J]. JOURNAL OF QUALITY TECHNOLOGY, 2004, 36 (04) : 343 - 366
[7] SHU L, 2004, QUAL ENG, V16, P437, DOI DOI 10.1081/QEN-120027945
[8] Sparks RS, 2000, J QUAL TECHNOL, V32, P157
[9] Woodall WH, 1999, J QUAL TECHNOL, V31, P376
[10] Wu Z, 2004, INT J PROD RES, V42, P379, DOI 10.1080/00207540310001614169

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