Soft X-rays shedding light on thin-film solar cell surfaces and interfaces

被引：4

作者：

Baer, M. ^{[1
,2
,3
]}

Pookpanratana, S. ^{[3
]}

Weinhardt, L. ^{[3
,4
,5
]}

Wilks, R. G. ^{[1
]}

Schubert, B. A. ^{[1
]}

Marsen, B. ^{[1
]}

Unold, T. ^{[1
]}

Blum, M. ^{[3
]}

Krause, S. ^{[3
]}

Zhang, Y. ^{[3
,6
]}

Ranasinghe, A. ^{[3
]}

Ramanathan, K. ^{[7
]}

Repins, I. ^{[7
]}

Contreras, M. A. ^{[7
]}

Nishiwaki, S. ^{[8
]}

Liu, X. ^{[9
,10
]}

Paudel, N. R. ^{[9
]}

Fuchs, O. ^{[11
]}

Niesen, T. P. ^{[12
]}

Yang, W. ^{[13
]}

Karg, F. ^{[12
]}

Compaan, A. D. ^{[9
]}

Shafarman, W. N. ^{[8
]}

Noufi, R. ^{[7
]}

Schock, H. -W. ^{[1
]}

Heske, C. ^{[3
,4
,5
,14
]}

机构：

[1] Helmholtz Zentrum Berlin Mat & Energie GmbH HZB, D-14109 Berlin, Germany

[2] Brandenburg Tech Univ Cottbus, Inst Phys & Chem, D-03046 Cottbus, Germany

[3] Univ Nevada, Las Vegas UNLV, Dept Chem, Las Vegas, NV 89154 USA

[4] Karlsruhe Inst Technol, Inst Photon Sci & Synchrotron Radiat, D-76344 Eggenstein Leopoldshafen, Germany

[5] Karlsruhe Inst Technol, ANKA Synchrotron Radiat Facil, D-76344 Eggenstein Leopoldshafen, Germany

[6] Xiamen Univ, Dept Phys, Xiamen 361005, Fujian, Peoples R China

[7] NREL, Golden, CO 80401 USA

[8] Univ Delaware, IEC, Newark, DE 19716 USA

[9] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA

[10] Chinese Acad Sci, Inst Elect Engn, Beijing 100190, Peoples R China

[11] Univ Wurzburg, D-97074 Wurzburg, Germany

[12] AVANCIS GmbH & Co KG, D-81739 Munich, Germany

[13] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, ALS, Berkeley, CA 94720 USA

[14] Karlsruhe Inst Technol, Inst Chem Technol & Polymer Chem, D-76128 Karlsruhe, Germany

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2013年 / 190卷

关键词：

Thin-film solar cells; Soft X-ray spectroscopy; Electron spectroscopy; Surfaces and interfaces; ELECTRICAL-PROPERTIES; DEVICE PERFORMANCE; BAND OFFSET; HETEROJUNCTION; CDTE; CHALCOPYRITE; CUINSE2; CU2ZNSNS4; GAP; CDS;

D O I：

10.1016/j.elspec.2012.10.004

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Thin-film solar cells based on compound semiconductors consist of a multilayer structure with various interfaces and contain a multitude of elements and impurities, etc. A rapid progress of these photovoltaic technologies can only be achieved by an insight-driven optimization/development. Hence it is crucial to characterize and understand the relationship between the chemical and electronic properties of these components. This paper reviews some examples of our recent work characterizing compound semiconductor thin films using laboratory- and synchrotron-based electron and soft X-ray spectroscopic characterization methods. It is demonstrated how these different analytical techniques are extraordinarily powerful to reveal the material characteristics from many different perspectives, ultimately resulting in a comprehensive picture of the related electronic and chemical properties. As examples, the paper will discuss the electronic surface structure of chalcopyrite thin-film solar cell absorbers, the chemical structure of the CdS/chalcopyrite interface, present the band alignment at the CdS/kesterite interface, and report on how post-deposition treatments cause chemical interaction/interdiffusion processes in CdTe/CdS thin-film solar cell structures. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：47 / 53

页数：7

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