Soft X-rays shedding light on thin-film solar cell surfaces and interfaces

Thin-film solar cells based on compound semiconductors consist of a multilayer structure with various interfaces and contain a multitude of elements and impurities, etc. A rapid progress of these photovoltaic technologies can only be achieved by an insight-driven optimization/development. Hence it is crucial to characterize and understand the relationship between the chemical and electronic properties of these components. This paper reviews some examples of our recent work characterizing compound semiconductor thin films using laboratory- and synchrotron-based electron and soft X-ray spectroscopic characterization methods. It is demonstrated how these different analytical techniques are extraordinarily powerful to reveal the material characteristics from many different perspectives, ultimately resulting in a comprehensive picture of the related electronic and chemical properties. As examples, the paper will discuss the electronic surface structure of chalcopyrite thin-film solar cell absorbers, the chemical structure of the CdS/chalcopyrite interface, present the band alignment at the CdS/kesterite interface, and report on how post-deposition treatments cause chemical interaction/interdiffusion processes in CdTe/CdS thin-film solar cell structures. (C) 2012 Elsevier B.V. All rights reserved.