Spectroscopy of hard X-rays (2-15 keV) generated by focusing femtosecond laser on metal targets

被引:25
作者
Fujimoto, Y
Hironaka, Y
Nakamura, KG
Kondo, K
Yoshida, M
Ohtani, M
Tsunemi, H
机构
[1] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, Toyonaka, Osaka 560, Japan
[2] Tokyo Inst Technol, Mat & Struct lab, Yokohama, Kanagawa 2268503, Japan
[3] Natl Inst Mat & Chem Res, Tsukuba, Ibaraki 3058565, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 12A期
关键词
femtosecond laser; picosecond; pulsed X-ray; X-ray spectroscopy;
D O I
10.1143/JJAP.38.6754
中图分类号
O59 [应用物理学];
学科分类号
摘要
Spectroscopy of hard X-rays generated by focusing a femtosecond laser (42 fs at 780 nm) onto metal targets consisting elements of various atomic number (Z) is carried out in the energy range between 2 and 15 keV using a direct-detection charge-coupled-device camera. Sharp K-shell line emissions are observed fur X-rays generated from medium-Z targets (Til Fe, Ni, Cu and Zn), which can be used for X-ray diffraction without further monochromization. A blond continuum and a weak trace of L-shell line emissions are observed fur X-rays from high-Z targets (Mo, Nb and W). The energies of the characteristic X-rays agree well with that of X-rays from neutral atoms or slightly ionized ions.
引用
收藏
页码:6754 / 6756
页数:3
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