XPS study of ion irradiated and unirradiated CeO2 bulk and thin film samples

被引：207

作者：

Maslakov, Konstantin, I ^{[1
]}

Teterin, Yury A. ^{[1
,2
]}

Popel, Aleksej J. ^{[3
]}

Teterin, Anton Yu ^{[2
]}

Ivanov, Kirill E. ^{[2
]}

Kalmykov, Stepan N. ^{[1
,2
]}

Petrov, Vladimir G. ^{[1
]}

Petrov, Peter K. ^{[4
,5
]}

Farnan, Ian ^{[3
]}

机构：

[1] Lomonosov Moscow State Univ, Chem Dept, Moscow 119991, Russia

[2] NRC Kurchatov Inst, Moscow 123182, Russia

[3] Univ Cambridge, Dept Earth Sci, Downing St, Cambridge CB2 3EQ, England

[4] Imperial Coll London, Dept Mat, London SW7 2AZ, England

[5] Imperial Coll London, London Ctr Nanotechnol, London SW7 2AZ, England

来源：

APPLIED SURFACE SCIENCE | 2018年 / 448卷

基金：

俄罗斯基础研究基金会; 英国工程与自然科学研究理事会;

关键词：

XPS; CeO2; Electronic structure; Ionic composition; Thin film; Radiation damage; X-RAY PHOTOELECTRON; SWIFT HEAVY-ION; CORE-LEVEL SPECTROSCOPY; RARE-EARTH-OXIDES; HIGH-ENERGY IONS; INDUCED REDUCTION; CERIUM COMPOUNDS; ELECTRON-SPECTROSCOPY; OXIDATION-STATE; HIGH BURNUP;

D O I：

10.1016/j.apsusc.2018.04.077

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

This work considers the effect of fission-energy ion irradiation on the electronic structure at the surface of bulk and thin film samples of CeO2 as a simulant for UO2 nuclear fuel. For this purpose, thin films of CeO2 grown on Si substrates and bulk CeO2 samples were irradiated by Xe ions (92 MeV, 4.8 x 10(15) ions/cm(2)) to simulate the fission damage that occurs within nuclear fuels. The irradiated and unirradiated samples were characterized by X-ray photoelectron spectroscopy. A technique of the quantitative evaluation of cerium ionic composition on the surface of the samples has been successfully applied to the obtained XPS spectra. This technique is based on the intensity of only one of the reliably identifiable highenergy peak at 916.6 eV in the Ce 3d XPS spectra. The as-produced samples were found to contain mostly the Ce4+ ions with a small fraction of Ce3+ ions formed on the surface in the air or under X-rays. The coreelectron XPS structure of CeO2 was associated with the complex final state with vacancies (holes) resulting from the photoemission of an inner electron. The Xe ion irradiation was found to increase the Ce3+ content in the samples of CeO2, with the thin films being more sensitive than the bulks samples. (C) 2018 The Authors. Published by Elsevier B.V.

引用

页码：154 / 162

页数：9

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