Modelling of the scan process in lateral force microscopy

被引：77

作者：

Holscher, H ^{[1
]}

Schwarz, UD ^{[1
]}

Wiesendanger, R ^{[1
]}

机构：

[1] UNIV HAMBURG,MICROSTRUCT RES CTR,D-20355 HAMBURG,GERMANY

来源：

SURFACE SCIENCE | 1997年 / 375卷 / 2-3期

关键词：

atomic force microscopy; friction; tribology;

D O I：

10.1016/S0039-6028(96)01285-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A model for the simulation of the profiling process of a scanning force microscope tip scanning a sample surface is introduced. Starting from the equations of motion, complete lateral force microscopy images as well as individual scan lines can be calculated. The model is applied to the constant-force mode of a lateral force microscope using a model potential for the tip-sample interaction which has the translational symmetry of a MoS2(001) surface. Comparison with recent experimental data shows good agreement. Subsequent analysis of the tip movement demonstrates the characteristic two-dimensional stick-slip behavior of the tip. In addition, the influence of the scan speed on the measured lateral forces is discussed. (C) 1997 Elsevier Science B.V.

引用

页码：395 / 402

页数：8

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