Fault diagnosis in a class of concurrent discrete event systems

被引：0

作者：

Ukawa, Y ^{[1
]}

Ushio, T ^{[1
]}

Takai, S ^{[1
]}

Yamamoto, S ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan

来源：

SICE 2003 ANNUAL CONFERENCE, VOLS 1-3 | 2003年

关键词：

concurrency; discrete event system; diagnosability; concurrent well-posedness;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we consider diagnosability of discrete event systems with simultaneous event occurrences, which we call concurrent discrete event systems. The systems have a problem that the number of event sets which may occur concurrently is increasing exponentially. So it is difficult to design a diagnoser. We introduce a notion of concurrent well-posedness(CWP). We then prove that CWP is a necessary and sufficient condition for no effect of concurrency on the diagnosability in concurrent discrete event systems.

引用

页码：2360 / 2363

页数：4

共 7 条

[1]

Hopcroft J. E., 2007, Introduction to Automata Theory, Languages and Computation

[2]

Hubbard P., 1999, Proceedings of the 38th IEEE Conference on Decision and Control (Cat. No.99CH36304), P2218, DOI 10.1109/CDC.1999.831250

[3]

Patton R. J., 1989, FAULT DIAGNOSIS DYNA

[4] DIAGNOSABILITY OF DISCRETE-EVENT SYSTEMS [J].

SAMPATH, M ;

SENGUPTA, R ;

LAFORTUNE, S ;

SINNAMOHIDEEN, K ;

TENEKETZIS, D .

IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1995, 40 (09) :1555-1575

[5]

TAKAI S, 2003, P 16 WORKSH CIRC SYS, P471

[6] CONCURRENCY AND STATE FEEDBACK IN DISCRETE-EVENT SYSTEMS [J].

USHIO, T ;

LI, Y ;

WONHAM, WM .

IEEE TRANSACTIONS ON AUTOMATIC CONTROL, 1992, 37 (08) :1180-1184

[7]

Ushio T, 1998, IEEE SYS MAN CYBERN, P113, DOI 10.1109/ICSMC.1998.725394

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