Fault diagnosis in a class of concurrent discrete event systems

被引：0

作者：

Ukawa, Y ^{[1
]}

Ushio, T ^{[1
]}

Takai, S ^{[1
]}

Yamamoto, S ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Engn Sci, Toyonaka, Osaka 5608531, Japan

来源：

SICE 2003 ANNUAL CONFERENCE, VOLS 1-3 | 2003年

关键词：

concurrency; discrete event system; diagnosability; concurrent well-posedness;

D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we consider diagnosability of discrete event systems with simultaneous event occurrences, which we call concurrent discrete event systems. The systems have a problem that the number of event sets which may occur concurrently is increasing exponentially. So it is difficult to design a diagnoser. We introduce a notion of concurrent well-posedness(CWP). We then prove that CWP is a necessary and sufficient condition for no effect of concurrency on the diagnosability in concurrent discrete event systems.

引用

页码：2360 / 2363

页数：4

共 7 条

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