Light-Induced Degradation in Red-Emitting ZnSiF6•6H2O:Mn4+ Hydrate Phosphor

被引:21
|
作者
Hoshino, Ryosuke [1 ]
Adachi, Sadao [1 ]
机构
[1] Gunma Univ, Fac Sci & Technol, Div Elect & Informat, Kiryu, Gunma 3768515, Japan
关键词
MANGANESE IONS; EMISSION; MN; BAMGAL10O17; MECHANISMS; RADIATION; RESONANCE; EFFICIENT; CRYSTALS; SPIN;
D O I
10.1149/2.0031408jss
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Photo-induced degradation behaviors of the red-emitting ZnSiF6 center dot 6H(2)O:Mn4+ hydrate phosphor are studied using X-ray diffraction measurement, photoluminescence (PL) analysis, PL excitation spectroscopy, PL decay analysis, diffuse reflectance spectroscopy, and electron spin resonance (ESR) measurement. The ZnSiF6 center dot 6H(2)O:Mn4+ hydrate phosphor exhibits remarkable degradation in the PL intensity under Xe lamp exposure for a few minutes. Coherent laser beams also induce degradation and its degree is in the order of Ar+ (488 nm) > He-Cd (325 nm) > He-Ne laser (632.8 nm). The degradation mechanism is found to be due to change in the valence state of manganese ions from Mn4+ to Mn5+ by the photooxidation (Mn4+ -> Mn5+) or disproportionation reaction (2Mn(4+) -> Mn3+ + Mn5+). This is supported by the facts that Mn4+ ion has larger absorbance at 488 urn than at 325 or 632.8 nm and that the Mn5+-related absorption structures appear in the diffuse reflectance spectra at wavelengths below similar to 700 nm. The ESR measurement also confirms the decreased Mn4+ spin density in the sample exposed with Xe lamp. A comparative discussion is given on the PL properties of the two different hydrate phosphors, ZnSiF6 center dot 6H(2)O:Mn4+ and K2SnF6 center dot H2O:Mn4+. (C) 2014 The Electrochemical Society. All rights reserved.
引用
收藏
页码:R144 / R149
页数:6
相关论文
共 50 条
  • [1] Optical spectroscopy of ZnSiF6•6H2O:Mn4+ red phosphor
    Hoshino, Ryosuke
    Adachi, Sadao
    JOURNAL OF APPLIED PHYSICS, 2013, 114 (21)
  • [2] Synthesis and luminescent properties of red-emitting phosphors: ZnSiF6•6H2O and ZnGeF6•6H2O doped with Mn4+
    Kubus, Mariusz
    Enseling, David
    Juestel, Thomas
    Meyer, H. -Juergen
    JOURNAL OF LUMINESCENCE, 2013, 137 : 88 - 92
  • [3] Optical spectroscopy and degradation behavior of ZnGeF6•6H2O:Mn4+ red-emitting phosphor
    Hoshino, Ryosuke
    Adachi, Sadao
    JOURNAL OF LUMINESCENCE, 2015, 162 : 63 - 71
  • [4] Photo-induced degradation and thermal decomposition in ZnSnF6•6H2O:Mn4+ red-emitting phosphor
    Hoshino, Ryosuke
    Adachi, Sadao
    OPTICAL MATERIALS, 2015, 48 : 36 - 43
  • [5] Unique properties of ZnTiF6 • 6H2O:Mn4+ red-emitting hexahydrate phosphor
    Hoshino, Ryosuke
    Sakurai, Shono
    Nakamura, Toshihiro
    Adachi, Sadao
    JOURNAL OF LUMINESCENCE, 2017, 184 : 160 - 168
  • [6] Luminescence properties and thermal stability of a red phosphor ZnSiF6 • 6H2O:Mn4+ synthesized by the one-step hydrothermal method
    Lv, Lifen
    Jiang, Xianyu
    Pan, Yuexiao
    Liu, Guokui
    Huang, Shaoming
    JOURNAL OF LUMINESCENCE, 2014, 152 : 214 - 217
  • [7] Synthesis and optical performance of a new red-emitting ZnTiF6•6H2O:Mn4+ phosphor for warm white-light-emitting diodes
    Zhong, J. S.
    Chen, D. Q.
    Wang, X.
    Chen, L. F.
    Yu, H.
    Ji, Z. G.
    Xiang, W. D.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2016, 662 : 232 - 239
  • [8] Structural change induced by thermal annealing of red-light-emitting ZnSnF6 • 6H2O:Mn4+ hexahydrate phosphor
    Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University, Kiryu, Gunma
    376-8515, Japan
    Jpn. J. Appl. Phys., 5
  • [9] Structural change induced by thermal annealing of red-light-emitting ZnSnF6•6H2O:Mn4+ hexahydrate phosphor
    Hoshino, Ryosuke
    Nakamura, Toshihiro
    Adachi, Sadao
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2016, 55 (05)
  • [10] Characterization and properties of red-emitting Sr2YNbO6:Mn4+ phosphor for white-light-emitting diodes
    Zuizhi Lu
    Xiaoshan Zhang
    Meixin Huang
    Lingling Wen
    Huan Wang
    Tianjiao Huang
    Liya Zhou
    Journal of Materials Science: Materials in Electronics, 2018, 29 : 17931 - 17938