Absolute phase unwrapping with SVM for fringe-projection profilometry

被引:6
作者
Xiang, Sen [1 ,2 ]
Deng, Huiping [1 ,2 ]
Wu, Jin [1 ,2 ]
Zhu, Changjian [3 ]
机构
[1] Wuhan Univ Sci & Technol, Sch Informat Sci & Engn, Wuhan 430081, Peoples R China
[2] MoE, Engn Res Ctr Met Automot & Measurement Technol, Wuhan 430081, Peoples R China
[3] Guangxi Normal Univ, Sch Elect Engn, Guilin 541004, Peoples R China
基金
中国国家自然科学基金;
关键词
support vector machines; surface topography measurement; learning (artificial intelligence); radial basis function networks; image capture; absolute phase unwrapping; fringe-projection profilometry; phase-based profilometry; support vector machine; learning-based method; wrapped phase; radial basis function kernel SVM; temporal unwrapping; complex quality-guided methods; SHAPE MEASUREMENT; SAR DATA; ALGORITHM; ACCURATE; MAPS;
D O I
10.1049/iet-ipr.2019.1611
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Phase unwrapping is a fundamental task in phase-based profilometry. Existing spatial and temporal approaches are facing challenges such as error propagation and low efficiency. In this study, the authors propose a learning-based method that uses a support vector machine (SVM) to perform phase unwrapping, where the problem is solved as a classification task. To be specific, seven elements, extracted from the captured patterns and the wrapped phase, form the input feature vector and the fringe order is the output class. Besides, a radial basis function kernel SVM is adopted as the model. The proposed method is conducted independently for every pixel, and does not suffer from error propagation in the spatial unwrapping. Moreover, it needs fewer patterns than temporal unwrapping since only one phase map is required. Simulation and experimental results demonstrate that the proposed scheme produces precise depth maps, which are comparable with the complex quality-guided methods but at a much faster speed.
引用
收藏
页码:2645 / 2651
页数:7
相关论文
共 50 条
[31]   Neuromorphic Fringe Projection Profilometry [J].
Mangalore, Ashish Rao ;
Seelamantula, Chandra Sekhar ;
Thakur, Chetan Singh .
IEEE SIGNAL PROCESSING LETTERS, 2020, 27 :1510-1514
[32]   Super-sensitive two-wavelength fringe projection profilometry with 2-sensitivities temporal unwrapping [J].
Servin, Manuel ;
Padilla, Moises ;
Garnica, Guillermo .
OPTICS AND LASERS IN ENGINEERING, 2018, 106 :68-74
[33]   Dual-Frequency Virtual-Stepping Fringe-Projection Profilometry Driven by Neural Network [J].
Guo, Bin ;
Ma, Suodong ;
Wang, Junxue ;
Liu, Linxin ;
Miao, Gaonan ;
Wang, Chinhua .
CHINESE JOURNAL OF LASERS-ZHONGGUO JIGUANG, 2025, 52 (01)
[34]   Absolute phase retrieval for a single-shot fringe projection profilometry based on deep learning [J].
Li, Wenjian ;
Yu, Jian ;
Gai, Shaoyan ;
Da, Feipeng .
OPTICAL ENGINEERING, 2021, 60 (06)
[35]   Selection of optimal frequencies in multiple-frequency fringe projection profilometry [J].
Petkovi, Tomislav ;
Pribani, Tomislav ;
Zoraja, Domagoj .
OPTICS AND LASERS IN ENGINEERING, 2023, 163
[36]   Image stitching for fringe projection profilometry [J].
Tornero-Martinez, Nadia ;
Anguiano-Morales, Marcelino ;
Trujillo-Schiaffino, Gerardo ;
Salas-Peimbert, Didia P. .
OPTICAL AND QUANTUM ELECTRONICS, 2021, 53 (06)
[37]   Phase error analysis and compensation in fringe projection profilometry [J].
Braeuer-Burchardt, Christian ;
Kuehmstedt, Peter ;
Notni, Gunther .
MODELING ASPECTS IN OPTICAL METROLOGY V, 2015, 9526
[38]   Fringe projection profilometry with a phase-coded optics [J].
Yan, Qi ;
Ma, Suodong ;
Chen, Xu ;
Xu, Feng ;
Huang, Qitai .
OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VIII, 2021, 11899
[39]   A Y-shaped network based single-shot absolute phase recovery method for fringe projection profilometry [J].
Tan, Hailong ;
Xu, Yuanping ;
Zhang, Chaolong ;
Xu, Zhijie ;
Kong, Chao ;
Tang, Dan ;
Guo, Benjun .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2024, 35 (03)
[40]   Regional fringe analysis for improving depth measurement in phase-shifting fringe projection profilometry [J].
Chien, Kuang-Che Chang ;
Tu, Han-Yen ;
Hsieh, Ching-Huang ;
Cheng, Chau-Jern ;
Chang, Chun-Yen .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2018, 29 (01)