Grazing angle mirror-backed reflection (GMBR) for infrared analysis of monolayers on silicon

被引：16

作者：

Liu, Hong-Bo

Xiao, Shou-Jun ^{[1
]}

Chen, Ya-Qing

Chao, Jie

Wang, Jing

Wang, Yue

Pan, Yi

You, Xiao-Zeng

Gu, Zhong-Ze

机构：

[1] Nanjing Univ, Sch Chem & Chem Engn, State Key Lab Coordinat Chem, Nanjing 210093, Peoples R China

[2] SE Univ, State Key Lab Mol & Biomol Elect, Nanjing 210096, Peoples R China

来源：

JOURNAL OF PHYSICAL CHEMISTRY B | 2006年 / 110卷 / 36期

关键词：

D O I：

10.1021/jp063467q

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

An easy handling infrared measurement, grazing angle mirror-backed reflection (GMBR), has been established to analyze the silicon-based organic monolayer. Theoretical prediction gave the optimal configuration with p-polarized irradiation near a grazing angle 78.1 of incidence. Experimental measurement of hydrogenterminated, undecylenic acid (UA) and N-hydroxysuccinimide (NHS) functionalized silicon (111) surfaces showed good signal peaks and reproducibility.

引用

页码：17702 / 17705

页数：4

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