Modelling Microstructures with OOF2

被引：75

作者：

Reid, Andrew C. E. ^{[1
]}

Lua, Rhonald C. ^{[2
]}

Garcia, R. Edwin ^{[3
]}

Coffman, Valerie R. ^{[2
]}

Langer, Stephen A. ^{[1
]}

机构：

[1] Natl Inst Stand & Technol, Informat Technol Lab, Gaithersburg, MD 20899 USA

[2] Natl Inst Stand & Technol, Mat Sci & Engn Lab, Gaithersburg, MD 20899 USA

[3] Purdue Univ, Sch Mat Engn, W Lafayette, IN 47907 USA

来源：

INTERNATIONAL JOURNAL OF MATERIALS & PRODUCT TECHNOLOGY | 2009年 / 35卷 / 3-4期

关键词：

finite element; microstructure;

D O I：

10.1504/IJMPT.2009.025687

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

OOF2 is a program designed to compute the properties and local behaviour of material microstructures, starting from a two-dimensional representation, an image, of arbitrary geometrical complexity. OOF2 uses the finite element method to resolve the local behaviour of a material, and is designed to be used by materials scientists with little or no computational background. It can solve for a wide range of physical phenomena and can be easily extended. This paper is an introduction to some of its most basic and important features.

引用

页码：361 / 373

页数：13