Comparison of a Multichip 10-V Programmable Josephson Voltage Standard System With a Superconductor-Insulator-Superconductor-Based Conventional System

被引：11
作者：
Yamada, Takahiro [1 ]
Murayama, Yasushi
Yamamori, Hirotake
Sasaki, Hitoshi
Shoji, Akira
Iwasa, Akio [1 ]
Nishinaka, Hidefumi
Nakamura, Yasuhiro [1 ]
机构：
[1] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan, Tsukuba, Ibaraki 3058568, Japan
来源：
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2009年 / 58卷 / 04期
关键词：
Digital-analog conversion; Josephson junctions (J[!text type='Js']Js[!/text]); multichip modules; standards; uncertainty; voltage; zener diodes; ARRAYS;
D O I：
10.1109/TIM.2008.2008580
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We developed a 10-V dc programmable Josephson voltage standard (PJVS) using a multichip technique. The PJVS was based on NbN/TiNx/NbN junctions and operated using a 10-K compact cryocooler. We carried out an indirect comparison with a superconductor-insulator-superconductor-based conventional Josephson voltage standard (JVS) by measuring the voltage of a 10-V zener diode reference standard. The combined standard uncertainty of the comparison was u(c), = 0.03 mu V(k = 1), and the relative combined standard uncertainty was 3 x 10(-9).
引用
收藏
页码：832 / 837
页数：6
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