Measurement of in-plane displacement with twofold sensitivity using phase reversal technique

被引：8
|
作者：
Mohan, NK [1 ]
机构：
[1] Indian Inst Technol, Dept Phys, Appl Opt Lab, Madras 600036, Tamil Nadu, India
来源：
OPTICAL ENGINEERING | 1999年 / 38卷 / 11期
关键词：
interferometers; speckle interferometry; phase shifts;
D O I：
10.1117/1.602246
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1964 / 1966
页数：3
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