Accurate measurement system for low loss materials

被引：0

作者：

Afsar, MN ^{[1
]}

Chen, S ^{[1
]}

Wang, Y ^{[1
]}

机构：

[1] Tufts Univ, Dept Elect & Comp Engn, Medford, MA 02155 USA

来源：

IRMMW-THz2005: The Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, Vols 1 and 2 | 2005年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper reports an improved Fabry-Perot open resonator operating at 60 GHz which is used to measure the dielectric properties of low-absorbing materials. Two techniques are employed, namely, frequency-variation and cavity-length-variation techniques. High resolution can be reached as small as 10 nano-meters, which makes the resonator an accurate system to provide precise measurements.

引用

页码：537 / 538

页数：2

共 6 条

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