X-ray diffraction measurements in high magnetic fields and at high temperatures

被引：9

作者：

Mitsui, Yoshifuru ^{[1
]}

Koyama, Keiichi ^{[1
]}

Watanabe, Kazuo ^{[1
]}

机构：

[1] Tohoku Univ, High Field Lab Superconducting Mat, Inst Mat Res, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS | 2009年 / 10卷 / 01期

关键词：

x-ray diffraction; magnetic field; shape-memory alloy; high temperature;

D O I：

10.1088/1468-6996/10/1/014612

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A system was developed measuring x-ray powder diffraction in high magnetic fields up to 5 T and at temperatures from 283 to 473 K. The stability of the temperature is within 1K over 6 h. In order to examine the ability of the system, the high-field x-ray diffraction measurements were carried out for Si and a Ni-based ferromagnetic shape-memory alloy. The results show that the x-ray powder diffraction measurements in high magnetic fields and at high temperatures are useful for materials research.

引用

页数：5

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