Optical constants and band gap determination of Pb0.95La0.05Zr0.54Ti0.46O3 thin films using spectroscopic ellipsometry and UV-visible spectroscopy

被引:30
作者
Barra, Vaishali [1 ]
Kotru, Sushma [1 ]
Varagas, M. [2 ]
Ramana, C. V. [2 ]
机构
[1] Univ Alabama, Dept Elect & Comp Engn, Tuscaloosa, AL 35401 USA
[2] Univ Texas El Paso, Dept Mech Engn, El Paso, TX 79968 USA
基金
美国国家科学基金会;
关键词
PLZT; Chemical solution deposition; Annealing; Band gap; Optical constants; PULSED-LASER DEPOSITION; ZIRCONATE-TITANATE; FERROELECTRIC PROPERTIES; MORPHOLOGY; PB;
D O I
10.1016/j.optmat.2015.08.019
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report the structural evolution and optical properties of lanthanum doped lead zirconate titanate (PLZT) thin films prepared on Pt/TiO2/SiO2/Si substrates by chemical solution deposition. X-ray diffraction demonstrates the post-deposition annealing induced crystallization for PLZT films annealed in a temperature (T-alpha) range of 550-750 degrees C. PLZT films annealed at higher temperature exhibit polycrystalline structure along with larger grain size. Optical band gap (E-g) values determined from UV-visible spectroscopy and spectroscopic ellipsometry (SE) for PLZT films were found to be in the range of 3.5-3.8 eV. E-g decreases with increasing T-alpha. The optical constants and their dispersion profiles for PLZT films were also determined from SE analyses. PLZT films show an index of refraction in the range of 2.46-2.50 (lambda = 632.8 nm) with increase in T-alpha. The increase in refractive index at higher T-alpha is attributed to the improved packing density and crystallinity with the temperature. (C) 2015 Published by Elsevier B.V.
引用
收藏
页码:123 / 128
页数:6
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